In this study, a free-fall drop tester was studied to test the impact reliability of small electronic components. The electronic component was fixed to the drop table and the table was fallen along guide rods. The impact energy was adjusted by the initial drop height, and the impact duration time was adjusted by inserted soft layers under the drop table. Table acceleration was achieved in the form of a half-sine that conforms to international standards. The developed tester was evaluated by a small printed circuit board. It was observed that the developed tester was fully utilized for the impact reliability assessment of electronic components.