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"Pill Ho Kim"

Article
In-situ Wired and Wireless Material Testing System with Nanometer-level Displacement Control
Kyoung Seok Park, Pill Ho Kim, Chung-Seog Oh
J. Korean Soc. Precis. Eng. 2024;41(11):881-888.
Published online November 1, 2024
DOI: https://doi.org/10.7736/JKSPE.024.086
To accurately assess mechanical properties of micro- and nano-sized specimens, a reliable material testing system is indispensable. However, due to small sizes of these test specimens, in-situ measurement of their mechanical behavior necessitates installing the tester within high-magnification microscopes such as SEM. Traditionally, researchers have used wired methods by placing the tester inside the SEM chamber and connecting it to an external controller via electrical feedthrough. Unfortunately, this approach is cumbersome. In addition, it limits its compatibility with other SEMs. In this study, we developed a compact controller capable of driving 3-axis piezoelectric actuators with nanometer-level displacement control resolution via Bluetooth communication. This innovative setup enables wireless control and data acquisition from outside the closed confines of an SEM chamber. To validate the versatility of our tester, we conducted both a nanoindentation test on a fused silica specimen using a Berkovich indenter in a wired configuration and a copper micropillar compression test wirelessly using a flat punch indenter within an SEM. By installing this tester in various measurement systems, researchers could observe deformation patterns in real time, making it a valuable tool for investigating deformation mechanisms of diverse micro- and nano-sized specimens.
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