Pinhole-free ionic conductors are critical to achieve optimal performance in thin film-solid oxide fuel cells (TF-SOFCs). However, nanoscale defects, especially pinholes, can induce current leakage and contribute to cell failure by creating electrical short circuits. This study introduced a novel methodology for detecting pinholes in yttria-stabilized zirconia (YSZ) thin-film solid oxide electrolytes. The approach utilized selective adsorption of silver (Ag) nanoparticles generated via a spark discharge generator (SDG). Analytical techniques, including focused ion beam (FIB), scanning electron microscopy (SEM), and transmission electron microscopy (TEM), were employed to investigate interactions between Ag nanoparticles and nanoscale defects. Results showed that nanoparticle-based diagnostic methods were efficacious for defect characterization, offering a solution for enhancing the quality of thin-film electrolytes.

In this study, Yttria-stabilized zirconia (YSZ) functional layers were applied with different thin-film fabrication process such as sputtering and atomic layer deposition (ALD) to enhance oxygen reduction reaction (ORR) for solid oxide fuel cells. We confirmed that the YSZ functional layer deposited with sputtering showed relatively low grain boundary density, while the YSZ functional layer deposited with the ALD technique clearly indicated high grain boundary density through scanning electron microscopy (SEM) and X-ray diffractometry (XRD) results. The YSZ functional layer coated with the ALD technique revealed that more ORR kinetics can occur using high grain boundary density than the functional layer deposited with sputtering. The peak power density of the SOFC deposited with ALD YSZ indicates 2-folds enhancement than the pristine SOFC.