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Fabrication of Micro Diamond Tip Cantilever for AFM-based Tribo-Nanolithography

Jeong Woo Park, Deug Woo Lee
JKSPE 2006;23(8):39-46.
Published online: August 1, 2006
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Nano-scale fabrication of silicon substrate based on the use of atomic force microscopy (AFM) was demonstrated. A specially designed cantilever with diamond tip, allowing the formation of damaged layer on silicon substrate by a simple scratching process, has been applied instead of conventional silicon cantilever for scanning. A thin mask layer forms in the substrate at the diamond tip-sample junction along scanning path of the tip. The mask layer withstands against wet chemical etching in aqueous KOH solution. Diamond tip acts as a patterning tool like mask film for lithography process. Hence these sequential processes, called tribo-nanolithography, TNL, can fabricate 2D or 3D micro structures in nanometer range. This study demonstrates the novel fabrication processes of the micro cantilever and diamond tip as a tool for TNL using micro-patterning, wet chemical etching and CVD. The developed TNL tools show outstanding machinability against single crystal silicon wafer. Hence, they are expected to have a possibility for industrial applications as a micro-to-nano machining tool.

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Fabrication of Micro Diamond Tip Cantilever for AFM-based Tribo-Nanolithography
J. Korean Soc. Precis. Eng.. 2006;23(8):39-46.   Published online August 1, 2006
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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Fabrication of Micro Diamond Tip Cantilever for AFM-based Tribo-Nanolithography
J. Korean Soc. Precis. Eng.. 2006;23(8):39-46.   Published online August 1, 2006
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