Measurement of Defects with Scanning Acoustic Microscope and Acoustic Emission

Man-Yong Choi; Ik-Gun Park; Eung-Kyo Han

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Measurement of Defects with Scanning Acoustic Microscope and Acoustic Emission

Man-Yong Choi, Ik-Gun Park, Eung-Kyo Han

JKSPE 1991;8(4):118-125.

Published online: December 1, 1991

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Measurement of Defects with Scanning Acoustic Microscope and Acoustic Emission

J. Korean Soc. Precis. Eng.. 1991;8(4):118-125. Published online December 1, 1991

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Measurement of Defects with Scanning Acoustic Microscope and Acoustic Emission

J. Korean Soc. Precis. Eng.. 1991;8(4):118-125. Published online December 1, 1991

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