Skip to main navigation Skip to main content
  • E-Submission

JKSPE : Journal of the Korean Society for Precision Engineering

OPEN ACCESS
ABOUT
BROWSE ARTICLES
EDITORIAL POLICIES
FOR CONTRIBUTORS
Article

Defect Measurement of Graphites for High Temperature Application by AE Technique

M. Y. Choi
JKSPE 1992;9(2):122-127.
Published online: June 1, 1992
  • 2 Views
  • 0 Download
  • 0 Crossref
  • 0 Scopus
prev next

Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:

Include:

Defect Measurement of Graphites for High Temperature Application by AE Technique
J. Korean Soc. Precis. Eng.. 1992;9(2):122-127.   Published online June 1, 1992
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:
Include:
Defect Measurement of Graphites for High Temperature Application by AE Technique
J. Korean Soc. Precis. Eng.. 1992;9(2):122-127.   Published online June 1, 1992
Close