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Micromachining of the Si Wafer Surface Using Femtoseocond Laser Pulses

Jae Gu Kim, Won Seok Chang, Sung Hak Cho, Kyung Hyun Whang, Suck Joo Na
JKSPE 2005;22(12):184-189.
Published online: December 1, 2005
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An experimental study of the femtosecond laser machining of Si materials was carried out. Direct laser machining of the materials for the feature size of a few micron scale has the advantage of low cost and simple process comparing to the semiconductor process, E-beam lithography, ECM and other machining process. Further, the femtosecond laser is the better tool to machine the micro parts due to its characteristics of minimizing the heat affected zone(HAZ). As a result of line cutting of Si, the optimal condition had the region of the effective energy of 2mJ/㎜-2.5mJ/㎜ with the power of 0.5㎽-1.5㎽. The polarization effects of the incident beam existed in the machining qualities, therefore the sample motion should be perpendicular to the projection of the electric vector. We also observed the periodic ripple patterns which come out in condition of the pulse overlap with the threshold energy. Finally, we could machined the groove with the linewidth of below 2 ㎛ for the application of MEMS device repairing, scribing and arbitrary patterning.

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Micromachining of the Si Wafer Surface Using Femtoseocond Laser Pulses
J. Korean Soc. Precis. Eng.. 2005;22(12):184-189.   Published online December 1, 2005
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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Micromachining of the Si Wafer Surface Using Femtoseocond Laser Pulses
J. Korean Soc. Precis. Eng.. 2005;22(12):184-189.   Published online December 1, 2005
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