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The Effect of Slurry Flow Rate and Temperature on CMP Characteristic

YoungSeok Jeong, HyoungJea Kim, Jaeyoung Choi, HaeDo Jeong
JKSPE 2004;21(11):46-52.
Published online: November 1, 2004
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CMP (Chemical-Mechanical Polishing) is a process in which both chemical and mechanical mechanisms act simultaneously to produce the planarized wafer. CMP process is an extensive usage and continuing high growth rates in the semiconductor industry. The understanding of the process, however, is much slower. The nature of material removal from the wafer is still undefined and ambiguous. Material removal rate according to the slurry flow rate is also undefined and ambiguous. Thus, in this study, the basic mechanism of material removal rate as slurry flow rate is defined in terms of energy supply and energy loss.

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The Effect of Slurry Flow Rate and Temperature on CMP Characteristic
J. Korean Soc. Precis. Eng.. 2004;21(11):46-52.   Published online November 1, 2004
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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The Effect of Slurry Flow Rate and Temperature on CMP Characteristic
J. Korean Soc. Precis. Eng.. 2004;21(11):46-52.   Published online November 1, 2004
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