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An Experimental Analysis on Dark-field Laser Scattering for the Surface Inspection of Infrared Cut-off Filters

Gyung Bum Kim, Jae Chul Han
JKSPE 2007;24(11):76-83.
Published online: November 1, 2007
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The dark-field laser scattering system has been developed to inspect surface defects in infrared cut-off filters and then laser scattering characteristics against the defects are investigated. The qualitative analysis for the reliable and accurate detection performance is described through the correlation between incident angles of a laser and viewing ones of a camera. In this paper, reliable and important information with laser scattering is given for the surface defect inspection of IR filters. Its performance has been verified through various experiments.

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An Experimental Analysis on Dark-field Laser Scattering for the Surface Inspection of Infrared Cut-off Filters
J. Korean Soc. Precis. Eng.. 2007;24(11):76-83.   Published online November 1, 2007
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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An Experimental Analysis on Dark-field Laser Scattering for the Surface Inspection of Infrared Cut-off Filters
J. Korean Soc. Precis. Eng.. 2007;24(11):76-83.   Published online November 1, 2007
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