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Design and Manufacture of an Electron Detector for Scanning Electron Microscope

Jong Up Jeon, Ji Won Kim
JKSPE 2008;25(4):53-60.
Published online: April 1, 2008
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Electron detectors used in scanning electron microscope accept electrons emitted from the specimen and convert them to an electrical signal that, after amplification, is used to modulate the gray-level intensities on a cathode ray tube, producing an image of the specimen. Electron detector is one of the key components dominating the performance of scanning electron microscope so that the development of electron detectors having high performance is indispensable to acquire high quality images using scanning electron microscope. In this paper, we designed and manufactured an electron detector and conducted a couple of image capture experiments using it. In particular, scintillator which generates light photons when it is struck by high-energy electrons was manufactured and experimental studies on the optimization of manufacturing condition was carried out. From experiments to evaluate the performance of our detector, it was verified that the performance of our detector is equivalent to or better than that of the conventional one.

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Design and Manufacture of an Electron Detector for Scanning Electron Microscope
J. Korean Soc. Precis. Eng.. 2008;25(4):53-60.   Published online April 1, 2008
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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Design and Manufacture of an Electron Detector for Scanning Electron Microscope
J. Korean Soc. Precis. Eng.. 2008;25(4):53-60.   Published online April 1, 2008
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