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An Analysis of Vacuum Plasma Phenomena in DBD(Dielectric Barrier Discharges)

Myoung-Soo Shin, Sung-Hoon Cha, Jong-Bong Kim, Jong-Ho Kim, Seong-Young Kim, Hye-Jin Lee
JKSPE 2009;26(3):122-128.
Published online: March 1, 2009
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DBD(Dielectric Barrier Discharges) plasma is often used to clean the surface of semiconductor. The cleaning performance is affected mainly by plasma density and duration time. In this study, the plasma density is predicted by coupled simulation of flow, chemistry mixing and reaction, plasma, and electric field. 13.56 ㎒ of RF source is used to generate plasma. The effect of dielectric thickness, gap distance, and flow velocity on plasma density is investigated. It is shown that the plasma density increases as the dielectric thickness decreases and the gap distance increases.

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An Analysis of Vacuum Plasma Phenomena in DBD(Dielectric Barrier Discharges)
J. Korean Soc. Precis. Eng.. 2009;26(3):122-128.   Published online March 1, 2009
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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An Analysis of Vacuum Plasma Phenomena in DBD(Dielectric Barrier Discharges)
J. Korean Soc. Precis. Eng.. 2009;26(3):122-128.   Published online March 1, 2009
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