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Applying Expert System to Statistical Process Control in Semiconductor Manufacturing

Gunsang Yun, Munkyu Choi, Hunmo Kim, Taeho Cho, Chilgee Lee
JKSPE 1998;15(10):103-112.
Published online: October 1, 1998
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Applying Expert System to Statistical Process Control in Semiconductor Manufacturing
J. Korean Soc. Precis. Eng.. 1998;15(10):103-112.   Published online October 1, 1998
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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Applying Expert System to Statistical Process Control in Semiconductor Manufacturing
J. Korean Soc. Precis. Eng.. 1998;15(10):103-112.   Published online October 1, 1998
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