Skip to main navigation Skip to main content
  • E-Submission

JKSPE : Journal of the Korean Society for Precision Engineering

OPEN ACCESS
ABOUT
BROWSE ARTICLES
EDITORIAL POLICIES
FOR CONTRIBUTORS
Article

Measured Intensity Control Method of a Phase-shift Measurement Based Laser Scanner by using APD Bias Voltage Characteristic

Jun Hwan Jang, Hee Sun Yoon, Sung Ui Hwang, Kyi Hwan Park
JKSPE 2012;29(10):1096-1100.
Published online: October 1, 2012
  • 2 Views
  • 0 Download
  • 0 Crossref
  • 0 Scopus
prev next

In the phase-shift measurement method, the distance light travels can be obtained based on the phase difference between the reference signal and the measured signal. When the object having various colors is measured, the intensity of the measured signal much varies even at the same distance, and it causes different phase delay due to wide dynamic range input to a signal processing circuit. In this work, an measured intensity control method is proposed to solve this phase delay problem.

Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:

Include:

Measured Intensity Control Method of a Phase-shift Measurement Based Laser Scanner by using APD Bias Voltage Characteristic
J. Korean Soc. Precis. Eng.. 2012;29(10):1096-1100.   Published online October 1, 2012
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:
Include:
Measured Intensity Control Method of a Phase-shift Measurement Based Laser Scanner by using APD Bias Voltage Characteristic
J. Korean Soc. Precis. Eng.. 2012;29(10):1096-1100.   Published online October 1, 2012
Close