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마이크로/나노 패터닝 공정 생산성 향상 기술 동향

A Review - Productivity Enhancements of Micro/Nano Patterning Methods -

Journal of the Korean Society for Precision Engineering 2018;35(11):1019-1026.
Published online: November 1, 2018

1 경북대학교 기계공학부

1 School of Mechanical Engineering, Kyungpook National University

#E-mail: mkkwak@knu.ac.kr, TEL: +82-53-950-5573
• Received: August 3, 2018   • Accepted: September 19, 2018

Copyright © The Korean Society for Precision Engineering

This is an Open-Access article distributed under the terms of the Creative Commons Attribution Non-Commercial License (http://creativecommons.org/licenses/by-nc/3.0) which permits unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited.

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Citations

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  • Variation of a Triangular Pattern Shape due to Shrinkage in the Repeated UV Imprint Process
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  • Finding Ways to Deform Fine Patterns Fabricated by UV Curable Resin
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A Review - Productivity Enhancements of Micro/Nano Patterning Methods -
J. Korean Soc. Precis. Eng.. 2018;35(11):1019-1026.   Published online November 1, 2018
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A Review - Productivity Enhancements of Micro/Nano Patterning Methods -
J. Korean Soc. Precis. Eng.. 2018;35(11):1019-1026.   Published online November 1, 2018
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A Review - Productivity Enhancements of Micro/Nano Patterning Methods -
Image Image Image Image Image Image Image Image Image
Fig. 1 A schematic diagram of the technology development process for improving the productivity of photolithography and NIL3,6,11,12 (reproduced from ref. 3, 6, 11, 12 with permission)
Fig. 2 Process schematic of the first NIL and prototype device of roll-to-roll NIL12 (reproduced from ref. 12 with permission)
Fig. 3 Schematics of seamless micro/nano patterning methods7-10 (reproduced from ref. 7-10 with permission)
Fig. 4 Schematics of visually tolerable tiling method and R2RNIL11 (reproduced from ref. 11 with permission)
Fig. 5 (a) SEM image of the seam part of micro-prismpatterns. (b) SEM image of step on the overlapped micro-gratings along the seam line. (c) Illustrations of complete wetting conditions with almost zero value of spreading coefficient. (d) Illustrations of partial wetting conditions with negative spreading coefficient11 (reproduced from ref. 11 with permission)
Fig. 6 (a) Photo images of TE and TM modes of the fabricated wire grid polarizer with original master size. (b) TE and TM mode images of the large area wire grid polarizer which was fabricated by VTT. Large area sample was made by eight times overlapped patterning. All samples in (a) and (b) were fabricated by 30 + 30 nm double side deposition. (c, d) SEM images of seam part of nano-wire grid polarizer patterns. (e, f) cross-sectional SEM images and performance data of the 15 + 30 nm and 30 + 30 nm double side deposited wire grid polarizer11 (reproduced from ref. 11 with permission)
Fig. 7 (a) Schematic illustration of R2R phase shift lithography (b) SEM image of Dense mesh pattern fabricated by R2RPSL (c) SEM image of Sparse mesh pattern (d) Enlarge SEM image of connection part (e) Photo image of fabricated transparent electrode (f) Transmittance of sample in e. (g) Sheet resistance of sample in e13 (reproduced from ref. 13 with permission)
Fig. 8 (a) Schematic illustration of R2R photolithography (b) SEM image of fabricated metal mesh patterns with various periods (c) Sheet resistance of fabricated transparent electrodes (d) Transmittance of fabricated transparent electrodes3 (reproduced from ref. 3 with permission)
Fig. 9 (a) Schematic illustration of PLED device (b) Light emission test of various PLED devices with bending (c) I-V curve of PLEDs (d) Images of bending test result3 (reproduced from ref. 3 with permission)
A Review - Productivity Enhancements of Micro/Nano Patterning Methods -