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The Study of Non-contact Thickness Measurement of Thin Transparent Object

Jun Hee Hong, Seok Kyu Jeong, Simon S. Park
JKSPE 2009;26(12):62-68.
Published online: December 1, 2009
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In this paper, we investigate a new method to measure the thickness of thin transparent objects utilizing a step index multi-mode optical fiber sensor. The method mainly depends on the refraction rate of transparent target, the diameter of optical fibers and the distance to reflector. We confirmed the effects of these parameters through the experimental verification tests. The comparison between the theoretical vs. analytical results shows good agreements with each other. The proposed model also enables users to measure the thickness of thin transparent objects without considering the reflection from the target. This approach provides simple, costeffective and non-contact solutions to measure the thickness.

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The Study of Non-contact Thickness Measurement of Thin Transparent Object
J. Korean Soc. Precis. Eng.. 2009;26(12):62-68.   Published online December 1, 2009
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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The Study of Non-contact Thickness Measurement of Thin Transparent Object
J. Korean Soc. Precis. Eng.. 2009;26(12):62-68.   Published online December 1, 2009
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